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Document Type: Example Program
NI Supported: Yes
Publish Date: Sep 6, 2006

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Detecting Frequency and RMS Amplitude of a Noisy Sine Wave

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Filename: detect_freq-amp.vi
Requirements: View

This example demonstrates how to use LabVIEW signal processing tools to obtain the frequency and RMS value of a simulated noisy sine wave. The example calculates the power spectrum, changes the units to volts RMS, and locates the peak and gets the value at the peak frequency.

This example generates a simulated sine wave with white noise using the Simulate Signal Express VI. The example then calculates the power spectrum of the signal with specified averaging and windowing. The power spectrum is then calculated, transformed to RMS values, and the peak value is obtained.

Requirements


Filename: detect_freq-amp.vi

Software Requirements


Application Software: LabVIEW Full Development System 7.0
Language(s): LabVIEW

 
2 ratings | 3.00 out of 5
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This example program (this "program") was developed by a National Instruments ("NI") Applications Engineer. Although technical support of this program may be made available by National Instruments, this program may not be completely tested and verified, and NI does not guarantee its quality in any way or that NI will continue to support this program with each new revision of related products and drivers. THIS EXAMPLE PROGRAM IS PROVIDED "AS IS" WITHOUT WARRANTY OF ANY KIND AND SUBJECT TO CERTAIN RESTRICTIONS AS MORE SPECIFICALLY SET FORTH IN NI.COM'S TERMS OF USE (http://ni.com/legal/termsofuse/unitedstates/us/).