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Document Type: Example Program
NI Supported: Yes
Publish Date: Sep 6, 2006


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Simultaneous Pattern I/O or Burst Mode I/O Using One 653x Device

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Filename: 202259.llb
Requirements: View

You can use this example to perform a self test on a 653X device. The example generates data on ports 0 and 1 (group 1) and reads data back on ports 2 and 3 (group 2). You can configure the data transfer method to be pattern I/O or burst mode handshaking.

The two groups are synchronized because group 1 (input) is configured to internally generate the clock while group 2 (output) is configured to use the external clock.
The VI compares the output data to the input data and returns an error when the values do not match. The Number of Errors indicator displays the number of patterns that did not match.

The clock frequency control is used only for pattern I/O mode. For burst mode, the PCLK rate is set to 20 MHz, but you can change the PCLK frequency by modifying the handshaking mode parameter settings, which you can view by scrolling left on the front panel.

I/O CONNECTIONS:
Make the following connections on the terminal block:
- Connect data lines from port 0 to port 2, and from port 1 to port 3
- Connect REQ 1 to REQ 2, ACK1 to ACK2, and PCLK1 to PCLK2

NOTE: Because of the high speed data transfer, you may run into reflection and termination issues especially in burst mode when PCLK is 20 MHz. You can eliminate reflections by one of the following methods:
- Use a shorter cable; try a 0.5 meter cable instead a 2 meter cable.
- Use TBX-2715 PXI terminal block if you have a PXI-653X device.
- Slow down the PCLK frequency. In handshaking mode parameters settings (scroll left on the front panel), change acknowledge modify mode to delay and acknowledge modify amount to 700 ns.

Requirements


Filename: 202259.llb

Software Requirements


Application Software: LabVIEW Full Development System 6.0
Language(s): LabVIEW

Hardware Requirements


Hardware Group: Multifunction DAQ (MIO)
Driver: Traditional NI-DAQ (Legacy) 6.9.1

 
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This example program (this "program") was developed by a National Instruments ("NI") Applications Engineer. Although technical support of this program may be made available by National Instruments, this program may not be completely tested and verified, and NI does not guarantee its quality in any way or that NI will continue to support this program with each new revision of related products and drivers. THIS EXAMPLE PROGRAM IS PROVIDED "AS IS" WITHOUT WARRANTY OF ANY KIND AND SUBJECT TO CERTAIN RESTRICTIONS AS MORE SPECIFICALLY SET FORTH IN NI.COM'S TERMS OF USE (http://ni.com/legal/termsofuse/unitedstates/us/).