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Digital Waveform Comparison with the NI 100MHz Logic Analyzer/Pattern Generator Solution

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Filename: digital_compare.zip
Requirements: View

This NI SignalExpress example demonstrates a standard stimulus-response application where a single NI 65xx high-speed digital I/O instrument is used to simultaneously generate and acquire a digital waveform. In software this example calculates and displays the number of bit errors in the acquired digital waveform.

Steps to Run:
1) Open the digital_compare.wbp file using SignalExpress version 1.1 or later

2) Connect channels 0-7 of your Digital Waveform Generator/Analyzer to channels 8-15, respectively.

3) Open the Load from HWS step and navigate to the "Ramp.hws" file.

4) Open the Digital Generate step and navigate to the same "Ramp.hws" file.

5) Click the "Run Once" button to execute the test. The NI 65xx generates an 8-bit digital ramp on channels 0-7 and receives the returned digital signal on channels 8-15. Next, the software compares the received response data to the original stimulus data. If the channels are wired together properly, there should be no bit errors. Notice the 2 data tabs that provide display information for comparing the stimulus and response data.

6) Open the step setup for the HSDIO Generate step. On the configuration tab, click on the file dialog box's "Browse" button to specify the waveform to generate. Navigate to "Ramp_ch7_errors.hws" file instead of the "Ramp.hws" file selected in Step 4. This new waveform file induces sample errors on channel 7 during generation.

7) Click the "Run Once" button again. This time, you see that the number of bit errors has risen, and the boolean indicator "passed?" has changed from "True" to "False."

Requirements


Filename: digital_compare.zip

Software Requirements


Application Software: SignalExpress Development System 1.1
Language(s): None

Hardware Requirements


Hardware Group: Digital I/O (DIO)
Hardware Model: PXI-6552, PXI-6542
Driver: NI-HSDIO 1.4

 
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This example program (this "program") was developed by a National Instruments ("NI") Applications Engineer. Although technical support of this program may be made available by National Instruments, this program may not be completely tested and verified, and NI does not guarantee its quality in any way or that NI will continue to support this program with each new revision of related products and drivers. THIS EXAMPLE PROGRAM IS PROVIDED "AS IS" WITHOUT WARRANTY OF ANY KIND AND SUBJECT TO CERTAIN RESTRICTIONS AS MORE SPECIFICALLY SET FORTH IN NI.COM'S TERMS OF USE (http://ni.com/legal/termsofuse/unitedstates/us/).