Academic Company Events NI Developer Zone Support Solutions Products & Services Contact NI MyNI

NI CompactDAQ Strain Gauge & Temperature Measurement Synchronized

1 ratings | 4.00 out of 5
Print

Overview

Synchronizing measurements of different types (strain, temperature, voltage) can be done by creating a single task that uses a common sample clock.

Downloads

Filename: cdaq_ai_multidevice_synch.vi
Requirements: View

I. Description: This VI performs acquires strain measurements and temperature measurements on different physical channels. The Sample Clock Rate is set for the Strain Gage measurement, DAQmx 8.5 sets the Sample Clock Rate appropriately for the Thermocouple measurement. II. Instructions for Running: 1. Configure Timing for Sample Clock. The Sampling Rate and Sample Clock Source must be configured. 2. Configure the Strain Gage Module (Channel, Gage and Bridge) Parameters. 3. Enter the list of physical channels for the thermocouple measurement. 4. Make sure all strain gages are in their relaxed state. 5. Run the VI and do not start straining the gages until data starts being plotted. III. Block Diagram Steps: 1. Create a Strain input task for your strain channels. 2. Create a Thermocouple input task for your thermocouple channels. 3. Set timing parameters. Note that sample mode set to Continuous Samples. 4. Select the Sample Clock source 5. Start the acquisitions 6. Read the Waveform data in a loop until the user hits the stop button or an error occurs. 7. Call the Clear Task VI to clear the Task. Use the popup dialog box to display an error if any. IV. I/O Connections Overview: Make sure your signal input terminal matches the Physical Channel I/O control.

Requirements


Filename: cdaq_ai_multidevice_synch.vi

Software Requirements


Language(s): LabVIEW

Hardware Requirements


Hardware Group: CompactDAQ, Multifunction DAQ (MIO)
Hardware Model: NI 9237, NI 9211
Driver: NI-DAQmx

 
1 ratings | 4.00 out of 5
Print

Reader Comments | Submit a comment »

 

Legal
This example program (this "program") was developed by a National Instruments ("NI") Applications Engineer. Although technical support of this program may be made available by National Instruments, this program may not be completely tested and verified, and NI does not guarantee its quality in any way or that NI will continue to support this program with each new revision of related products and drivers. THIS EXAMPLE PROGRAM IS PROVIDED "AS IS" WITHOUT WARRANTY OF ANY KIND AND SUBJECT TO CERTAIN RESTRICTIONS AS MORE SPECIFICALLY SET FORTH IN NI.COM'S TERMS OF USE (http://ni.com/legal/termsofuse/unitedstates/us/).