Parallel Testing with Auto Scheduling NI TestStand Downloadable Demo
This is a software-only demo that illustrates the benefits of testing multiple devices (DUTs) simultaneously using one set of shared instruments.
The demo demonstrates testing four Android smart phones using NI TestStand. Four different tests are run on each phone - a power consumption test, a GPS test, a audio quality test and a video quality test. We assume that each type of test uses a different type of instrument (The power consumption test, for instance, uses a batter simulator).
First, each phone is tested sequentially. This takes the longest amount of time. Since each instrument runs only one of the four tests, each test instrument is left unused for a long time. Rather than being idle, these instruments could be used to test one of the other phones.
Next, the phones are tested in parallel. This yields a performance improvement over testing sequentially. However, because of the shared instruments, we observe a pipelining effect. The instruments are still not utilized in an optimal fashion.
Finally, the four phones are tested in parallel using NI TestStand's auto scheduling feature that further reduces the test time and increases instrument usage. Auto Scheulding automatically picks which test to run on each phone at a given time based on which instrument is currently free.
For more information on NI TestStand's parallel testing capabilities, visit ni.com/teststand/optimize/.
Note: If you do not have the required software, you can still download and watch the video of the test execution.
Application Software: NI TestStand Development System 2010 SP1, LabVIEW Full Development System 2011
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