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Document Type: Instrumentation Newsletter
NI Supported: Yes
Publish Date: Feb 12, 2010


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A C Series Platform for Every Application – 100 Modules and Counting

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With more than 50 NI modules, 50 third-party modules, and a multitude of chassis available, there are several configuration options within the NI C Series platform to address a variety of application needs. Deploy these configurations as a stand-alone system or over USB, Ethernet, or wireless.

 

 

 

Industrial Control and Monitoring with CompactRIO

For an industrial machine control and monitoring solution complete with real-time math, advanced analysis, and control, add the NI 9234 module for vibration monitoring and digital modules for PWM and proportional integral derivative (PID) control to an NI CompactRIO system.

Remote Determinism with CompactRIO Expansion

 

For applications that require distributed determinism, add an NI 9234 module to an NI 9144 expansion chassis to provide deterministic communication and a field-programmable gate array (FPGA) for distributed real-time signal processing, monitoring, and control functions.

Mixed-Sensor Test with NI CompactDAQ

For applications such as appliance test, the NI 9234 module measures sound or noise level and can be combined with modules for temperature, power, and other signals in an NI CompactDAQ chassis for a complete measurement system

Portable Measurement System with USB

When used with the NI USB-9162 carrier and a netbook, the NI 9234 module becomes an ultraportable measurement system that fits in a small pouch and can gather bearing vibration data for machine condition monitoring applications.

Remote Monitoring and Test with Ethernet or Wireless C Series

Insert a high-speed sound or vibration measurement into a manufacturing process that is down the line or across the factory by installing the NI 9234 module in an Ethernet or wireless carrier. The measurements take place on the floor while you stay in the control room.

Learn more about the C Series platform.

This article first appeared in the Q1 2010 issue of Instrumentation Newsletter

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