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Document Type: Instrumentation Newsletter
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Publish Date: Feb 19, 2008


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Attend the 2008 Virtual Automated Test Summit Presented Live Online  

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Since 2004, National Instruments has joined other leading test and measurement companies in hosting the Automated Test Summit, a series of technical events addressing industry trends and identifying solutions to current challenges in automated test. In response to growing interest, NI began seeking ways to share the event’s technical content, expert opinions, and vendor resources with more engineers and managers around the world, leading to the first Virtual Automated Test Summit online in 2007. Building on the success of last year’s event, NI and its global partners are pleased to present the 2008 Virtual Automated Test Summit this June, which focuses on strategies for reducing the cost of test. View live keynotes and technical sessions from distinguished experts, participate in Q&A forums, and interact with representatives from more than 20 test and measurement companies through a virtual exhibition environment – all from the convenience of your desk.


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Explore the exhibition floor, visit booths, and attend technical presentations all within a virtual environment.

View the agenda and register for the 2008 Virtual Automated Test Summit.

 

NI Technical Symposium Presentations Available Online

National Instruments completed its most recent NI Technical Symposium events in December 2007, covering 25 cities across the United States and Canada with one-day seminars. The 2007 symposium showcased the newest technologies for improving system performance through the use of multicore technology in NI LabVIEW software and the latest test and control applications using FPGAs for hardware flexibility and application-specific operation. The symposium included keynote presentations from NI experts as well as a variety of technical and hands-on sessions on new products and application development.

View the presentations online.

 

Introducing the NIWeek Graphical System Design Achievement Awards

At NIWeek 2008, National Instruments is unveiling the first Graphical System Design Achievement Awards, recognizing global advancements in engineering and science. Take this opportunity to share your innovations with 2,700 attendees and more than 90 editors and to network with the other category winners at the invitation-only awards ceremony. Winners also have the chance to be published in a major industry publication.  

Select from 10 categories including aerospace/defense, biotechnology/life sciences, electrical/electronics, and mechatronics. Submissions are due March 24. If you have any questions regarding the Graphical System Design Achievement Awards, please e-mail paper.contest@ni.com.

View a complete list of categories and download the author submission packet.

This article first appeared in the Q1 2008 issue of Instrumentation Newsletter.

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