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Document Type: Instrumentation Newsletter
NI Supported: Yes
Publish Date: May 19, 2008


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Compact FieldPoint Performance Increase

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Three new NI Compact FieldPoint controllers offer higher performance, increased processor speed, and significantly improved Ethernet throughput over existing Compact FieldPoint controllers. The NI cFP-2220, cFP-2210, and cFP-2200 are equipped with a 400 MHz Freescale MPC5200 processor and offer 10 times the Ethernet throughput of existing devices. For extreme reliability and determinism, these controllers run NI LabVIEW Real-Time software on the Wind River VxWorks real-time OS, providing the functionality, connectivity, and flexibility of LabVIEW on a small, rugged platform. The Compact FieldPoint platform also meets industrial certifications including the following: 

  • Industrial operating temperature range from -40 to 70 °C 
  • 50 g shock, 5 g vibration 
  • HazLoc certifications with Class I, Division 2 and ATEX 
  • Built-in signal conditioning with isolation 

The new cFP-2220 controller provides dual Ethernet ports, a removable CompactFlash slot, and a USB port.

These Compact FieldPoint controllers provide up to 256 MB of DRAM and 256 MB of internal, nonvolatile storage – twice the memory and storage of previous versions. For additional storage, the cFP-2220 includes a removable CompactFlash slot for rugged data-logging applications and a USB port for field accessibility. The cFP-2220 also offers dual Ethernet ports for connectivity to enterprise and dedicated I/O networks as well as three RS232 ports and one RS485 port for serial devices. 

These controllers mark the first release of fully RoHS-compliant products for the Compact FieldPoint platform, and they represent the NI commitment to eliminating certain hazardous substances to benefit the environment. NI plans to convert the entire Compact FieldPoint product line to meet RoHS compliance standards by 2010. 

View a tutorial on real-time performance benchmarks for Compact FieldPoint controllers. 

This article first appeared in the Q2 2008 issue of Instrumentation Newsletter.

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