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Document Type: Instrumentation Newsletter
NI Supported: Yes
Publish Date: Aug 7, 2008


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New 1 GHz Bandwidth PXI Digitizer Is Optimized for Automated Test

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NI is expanding the performance and capabilities of its PXI digitizer/ PC-based oscilloscope offering with a new high-bandwidth digitizer. The NI PXI-5154 dual-channel, 1 GHz bandwidth digitizer/oscilloscope provides up to a 2 GS/s real-time sample rate (20 GS/s equivalent-time sample rate for repetitive signals), making it ideal for acquiring and characterizing fast, nanosecond edges. Equipped with deep onboard memory of up to 256 MB per channel, the digitizer offers high sustained sample rates over extended data capture windows. It is well-suited for automated test applications in the consumer electronics, semiconductor, life sciences, and aerospace/defense industries.

The new 1 GHz bandwidth PXI digitizer is ideal for acquiring and characterizing fast, nanosecond edges. 

You can use the new digitizer with NI LabVIEW SignalExpress software to acquire data, perform measurements, and drag and drop results into Microsoft Excel without programming. In addition, the NI-SCOPE driver installs more than 50 prewritten example programs that illustrate the full functionality of any NI digitizer in LabVIEW or LabWindows/CVI software.

Optimized for Automated Test

With NI T-Clock synchronization technology, you can integrate the digitizer with other NI hardware to build a complete, automated mixed-signal test system, or you can synchronize multiple PXI-5154 digitizers to create systems with up to 34 1 GS/s, phase-synchronous channels in a single chassis. Combining strong instrument integration with the high-throughput PXI bus for lower test times, the PXI-5154 digitizer is ideal for high-bandwidth automated measurements.

The mark LabWindows is used under a license from Microsoft Corporation. Windows is a registered trademark of Microsoft Corporation in the United States and other countries. 

View PXI-5154 digitizer specifications and pricing.

This article first appeared in the Q3 2008 issue of Instrumentation Newsletter.

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