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Since 2004, National Instruments and other leading test and measurement companies have hosted the Automated Test Summit, an online series of technical sessions focused on best practices in automated test.
Due to the growing demand for free industry training on how to optimize the value and performance of automated test systems, at this year’s summit, more than 15 test and measurement companies will present practical techniques to reduce the cost of test by applying proven methods from the top trends in automated test. They will focus on the use of those methods in five key application areas: aerospace and defense, RF and wireless, audio and video, automotive, and semiconductor test.
View the 2009 Virtual Automated Test Summit live online on May 20 and get immediate access to all presentations and technical resources.
View the agenda and log into the event.
NIWeek 2009 Early-Bird Registration Ends May 31
NIWeek 2009, the 15th annual worldwide graphical system design conference, is the ultimate event to receive in-depth technical training on NI product advancements and trends within the test, control, and design marketplace. The conference runs August 4–6, 2009, in Austin, Texas.
This article first appeared in the Q2 2009 issue of Instrumentation Newsletter.
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