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Publish Date: Mar 13, 2008


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Configure Your Machine Condition Monitoring System Using National Instruments Products

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Overview

Machine health and predictive maintenance is critical to every plant's reliability program. Machine manufacturers use the same data collection and analysis for factory acceptance test. Whether you are in-plant or factory test focused, the NI Machine Condition Monitoring and Machine Test platform provides the test and analysis you need, including on-line and off-line analysis capabilities, high-speed time waveform logging, Ethernet connectivity with client/server architectures, data acquisition, data analysis, and data presentation all in one platform. And you get it all at a competitive price with flexibility to integrate with current systems and expand with your company's needs.

A Typical Machine Condition Monitoring System

Below is a block diagram for a typical machine condition monitoring system. Hardware components include sensors, controllers, data acquisition i/o and networking interfaces. Software components include analysis and control tools.


Software

For machine condition monitoring software, LabVIEW combines advanced analysis with a user defined GUI (graphical user interface), or HMI (human machine interface).  By implementing a software solution based on a programming environment, LabVIEW, you will have complete control over the look and feel of your monitoring system.  In addition to a custom interface, LabVIEW and the Sound & Vibration Measurement Suite, contain hundreds of analysis functions such as FFT, Order analysis, RMS, Peak Detection and many more.  Learn more about the software implementation by viewing the "Using LabVIEW for Embedded Condition Monitoring and Machine Protection" webcast.

 

The images below display the variety of some of the analysis functions that are available as well as user interface customization.

Orbit Plot and Analysis in LabVIEW

 

 

Polar Plots

 

 

 

Waterfall Plots for Run-up Analysis

 

 

Custom Data Views and Charts

 

 

Hardware Products for Machine Condition Monitoring

There are primarily two hardware systems from NI for machine condition monitoring; PXI and C Series.

PXI C Series
  • High performance processing
  • High channel count systems (500+)
  • Solid-state hard drives available for rugged data storage
  • Ethernet, RS-232, CAN, and many  industrial com busses available
  • Sample rates at over 200kS/s/ch
  • Rugged operating specs (temp and shock)
  • Portable or Fixed implementation
  • USB based system with CompactDAQ
  • Embedded processing and storage with CompactRIO
  • 4 to 32 channel systems for distributed monitoring
  • Sample rates at up to 50kS/s/ch

 

PXI: 

The PXI Based Configuration provides the highest dynamic range and best signal conditioning options available from National Instruments. This solution, when configured as a LabVIEW Real-Time application, provides an ideal remote monitoring and field diagnostics tool.

C Series: 

The C Series based configuration provides a rugged, flexible set of hardware for creating either a portable or a permanently mounted machine condition monitoring system.  With an operating temperature range of -40°C to 70°C, and a shock rating of up to 30g's, the C Series line of hardware is ideal for more rugged environments.  Over 40 C Series modules are available for everything from proximity probes and accelerometers, to temperature and strain. Control can be added by using digital I/O modules or the available analog output modules.

 

  • NI CompactDAQ chassis for 8 modules over USB
  • C Series USB carrier for a single module over USB
  • NI CompactRIO for up to 8 modules with on-board processing and storage
  • NI 9233 - Dynamic Signal Acquisition for accelerometers and microphones (4 channel module)
  • NI 9229 - Dynamic Signal Acquisition for ±60V input (4 channel module)
  • NI 9239 - Dynamic Signal Acquisition for ±10V input (4 channel module)
  • NI 9219 - Universal module for temp, voltage, current, strain with ch-ch isolation (4 channel)
  • NI 9217 - RTD module


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- Jul 26, 2004

 

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This tutorial (this "tutorial") was developed by National Instruments ("NI"). Although technical support of this tutorial may be made available by National Instruments, the content in this tutorial may not be completely tested and verified, and NI does not guarantee its quality in any way or that NI will continue to support this content with each new revision of related products and drivers. THIS TUTORIAL IS PROVIDED "AS IS" WITHOUT WARRANTY OF ANY KIND AND SUBJECT TO CERTAIN RESTRICTIONS AS MORE SPECIFICALLY SET FORTH IN NI.COM'S TERMS OF USE (http://ni.com/legal/termsofuse/unitedstates/us/).