Configure Your Machine Condition Monitoring System Using National Instruments Products
Overview
Machine health and predictive maintenance is critical to every plant's reliability program. Machine manufacturers use the same data collection and analysis for factory acceptance test. Whether you are in-plant or factory test focused, the NI machine condition monitoring and machine test platform provides the test and analysis you need, including online and off-line analysis capabilities, high-speed time waveform logging, Ethernet connectivity with client/server architectures, data acquisition, data analysis, and data presentation all in one platform. And you get it all at a competitive price with flexibility to integrate with current systems and expand with your company's needs.
Table of Contents
A Typical Machine Condition Monitoring System
Figure 1 shows a block diagram for a typical machine condition monitoring system. Hardware components include sensors, controllers, data acquisition I/O, and networking interfaces. Software components include analysis and control tools.

Figure 1. Block Diagram of a Typical Machine Condition Monitoring System
Hardware Products for Machine Condition Monitoring
There are two primary hardware systems from NI for machine condition monitoring: PXI and C Series.
| PXI | C Series |
|
|
- Use the NI CompactRIO Advisor to build your own embedded system
- Use the NI CompactDAQ Advisor to build your own portable system
- Use the PXI Advisor to build your own high-performance, high-channel-count system
PXI
The PXI-based configuration provides the highest dynamic range and best signal conditioning options available from National Instruments. This solution, when configured as a LabVIEW Real-Time application, offers an ideal remote monitoring and field diagnostics tool.
- PXI chassis home page
- PXI embedded controller (Windows)
- PXI embedded controller (real-time OS)
- NI PXI-4472 - dynamic signal acquisition for accelerometers, proximity probes, and tachs (8-channel module)
- NI PXI-4498 - dynamic signal acquisition for accelerometers, proximity probes, and tachs (16-channel module)
- Other PXI modules
C Series
The C Series-based configuration provides a rugged, flexible set of hardware for creating either a portable or a permanently mounted machine condition monitoring system. With an operating temperature range of -40 to 70 °C and a shock rating of up to 30 g, the C Series line of hardware is ideal for more rugged environments. More than 50 C Series modules are available for everything from proximity probes and accelerometers to temperature and strain. You can add control by using digital I/O modules or analog output modules.
- NI CompactDAQ chassis for up to eight modules over USB/Ethernet/wireless
- NI CompactRIO for up to eight modules with onboard processing and storage
- NI 9234 - dynamic signal acquisition for accelerometers and microphones (4-channel module)
- NI 9229 - dynamic signal acquisition for ±60 V input (4-channel module)
- NI 9239 - dynamic signal acquisition for ±10 V input (4-channel module)
- NI 9237 - dynamic signal acquisition for bridge-based measurements like strain (4-channel module)
- NI 9219 - universal module for temp, voltage, current, strain with channel-to-channel isolation (4-channel module)
- NI 9217 - RTD module
- NI 9211 - thermocouple module (4-channel module)
Software
As machine condition monitoring software, NI LabVIEW combines advanced analysis with a user-defined graphical user interface (GUI) or human machine interface (HMI). By implementing a software solution based on the LabVIEW programming environment, you can completely control the look and feel of your monitoring system. In addition to a custom interface, LabVIEW and the NI Sound and Vibration Measurement Suite contain hundreds of analysis functions such as fast Fourier transform (FFT), order analysis, RMS, and peak detection. Learn more about the software implementation by viewing the Using LabVIEW for Embedded Condition Monitoring and Machine Protection webcast.
The images below display the variety of some of the analysis functions that are available as well as user interface customization.
Figure 2. Orbit Plot and Analysis in LabVIEW
Figure 3. Polar Plots
Figure 4. Waterfall Plots for Run-Up Analysis
Figure 5. Custom Data Views and Charts
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Poor link capatibilities
The proposed products should have a link to
detailed information. A lot of work to find
the products otherwise.
- Jul 26, 2004
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