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National Instruments has developed an extensive collection of technical guides to assist you with all elements of your test system design. The content for these guides is based on best practices shared by industry-leading test engineering teams that participate in NI customer advisory boards and the expertise of the NI test engineering and product research and development teams. Ultimately, these resources teach you test engineering best practices in a practical and reusable manner.
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Table of Contents
Executive Summary: Designing Next Generation Test Systems
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Test managers and engineers are now implementing modular, software defined test architectures based on widely adopted industry standards to provide:
Increased test system longevity
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Guidelines for Designing Next Generation Test Systems
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1. Test Management Software Strategy for Reducing Development Cycles and Cost
2. Choosing the Right Software Application Development Environment
3. Hybrid Systems: Integrating Your Multi-Vendor, Multi-Platform Test Equipment
4. Instrument Bus Performance: Making Sense of Competing Bus Technologies for Instrument Control
5. Understanding a Modular Instrumentation System for Automated Test
6. PXI: The Industry Standard Platform for Instrumentation
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Strategies for Improving Test System Performance
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7. Maximizing the Throughput of Your Automated Test System Tips on choosing the highest-throughput bus for your application Select Software that Takes Full Advantage of the Technology
9. Designing and maintaining a test system for Longevity
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Case Studies and Customer Applications
Reader Comments | Submit a comment »
There is a typo on page 5-7 in Bus
performance summary. The typo is
GPIB instead of GBIB.
- MANJUNATHA SHEELAVANTHAR, EATON. manjunathas@eaton.com - Oct 25, 2008
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