Digital I/O Fundamentals
PrintOverview
As part of the National Instruments Measurement Fundamentals Series, this set of tutorials helps you learn about a specific common measurement application topic through theory explanations and practical examples.
What You Learn
A wide range of systems and applications incorporate digital devices and signals so advancing your digital fundamental knowledge is important for mastering many of today's test and automation applications. This set of tutorials provides you with essential information about the nature of digital signals, digtial measurements, and the devices used to generate, analyze, and control these signals.
View the in-depth Next-Generation Test System Developers Guide to learn how to incorporate these measurements into an automated test system.
Table of Contents
Fundamentals of Digital I/O
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| Voltage Levels are what defines how a device determines a valid logic state (logic high level or logic low level). Learn More>> |
 | Logic Families (Single-ended vs Differential) are groups of logic circuits with standardized voltage levels that constitute a voltage high or low level. All circuits within a logic family are compatible with other circuits within that family, since they share the same characteristics. Learn More >> |
 | Clocked Digital I/O Generation, Acquisition, and Compare are digital operations where binary data is sent or received from a digital device to a device under test (DUT) across multiple pins/channels. Learn More >> |
 | Termination is important principle to understand when designing high-speed digital so that you can maximize signal quality and minimize the effects of signal reflections Learn More>> |
 | Industrial Digital I/O Features include isolation, higher voltage levels, programmable power-up states, change-of-state detection, watchdog timers and industrial certifications. Learn More >> |
Common Terminology and Definitions for Digital I/O
| Digital Definitions | Digital Concepts |
Rise time and fall timeExamples of Digital I/O Applications
Device Verification/Characterization
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Choosing the Correct NI Digital I/O Device for Test, Control, and Design
| National Instruments provides a wide range of digital I/O (DIO) products with different speed, voltage, and timing options to meet the digital needs of your test, control, and design applications. Click on the links below to determine which product line offers the ideal feature set for your application. |
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