Overview
The NI Modular Instruments Online Application Demonstrations present several areas in which these products have been very successful. These are only a few of the many ways that NI Modular Instruments can help our customers develop solutions specific to their needs.
Bit Error Rate Testing (BERT)
In this application demonstration, a National Instruments Digital Waveform Generator/Analyzer is used to calculate the bit error rate of a simple logic device. The error detection is performed on-the-fly on a per-channel per-clock-cycle basis.
View Demo >>DAC Testing: INL and DNL
In this application demonstration, a National Instruments Digital Waveform Generator/Analyzer and High Speed Digitizer are used together to test the performance of a digital to analog converter (DAC). By sending a digital ramp to the DAC and comparing the acquired response to an ideal response, both the Integral Non-Linearity (INL) and Differential Non-Linearity (DNL) are calculated.
Memory Testing
In this application demonstration, a National Instruments Digital Waveform Generator/Analyzer is used to test the functionality of a simple memory device as well as to characterize its access time. The functional test employs the per-channel per-clock-cycle comparison features of the Digital waveform Generator/Analyzer.
Production Line Audio Testing
In this application demonstration, a National Instruments Dynamic Signal Acquisition (DSA) card is used along with the Sound and Vibration Toolkit (SVT) to characterize an audio amplifier. National Instruments TestStand is also employed to automate the testing using synchronized DSA devices and calculations of distortion and frequency response.
Ultrasonic Non-Destructive Testing
In this application demonstration, a simple implementation of an Ultrasonic Non-Destructive Testing (NDT) application is accomplished using a National Instruments High Speed Digitizer and a Panametrics-NDT Pulser/Receiver. The device under test is a glass block which is tested for depth to expose flaws in the material.
In this application demonstration, a Composite Video (CVBS) signal adhering to the NTSC standard is generated using a National Instruments Arbitrary Waveform Generator and then passed through a video switch. The resulting signal is then measured using a National Instruments High Speed Digitizer and characterized for compliance using VideoMASTER from microLEX.
11 ratings | 4.82 out of 5
Print
Legal
This tutorial (this "tutorial") was developed by National Instruments ("NI"). Although technical support of this tutorial may be made available by National Instruments, the content in this tutorial may not be completely tested and verified, and NI does not guarantee its quality in any way or that NI will continue to support this content with each new revision of related products and drivers. THIS TUTORIAL IS PROVIDED "AS IS" WITHOUT WARRANTY OF ANY KIND AND SUBJECT TO CERTAIN RESTRICTIONS AS MORE SPECIFICALLY SET FORTH IN NI.COM'S TERMS OF USE (http://ni.com/legal/termsofuse/unitedstates/us/).
