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Document Type: Tutorial
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Publish Date: Oct 13, 2006

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Advanced Pattern Matching Concepts

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This document contains information about the advanced pattern matching capabilities in IMAQ Vision version 6.1 and later. Advanced pattern matching contains low-level learning and matching options that enable you to customize the pattern matching algorithm to your specific machine vision application.




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This tutorial (this "tutorial") was developed by National Instruments ("NI"). Although technical support of this tutorial may be made available by National Instruments, the content in this tutorial may not be completely tested and verified, and NI does not guarantee its quality in any way or that NI will continue to support this content with each new revision of related products and drivers. THIS TUTORIAL IS PROVIDED "AS IS" WITHOUT WARRANTY OF ANY KIND AND SUBJECT TO CERTAIN RESTRICTIONS AS MORE SPECIFICALLY SET FORTH IN NI.COM'S TERMS OF USE (http://ni.com/legal/termsofuse/unitedstates/us/).