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Document Type: Tutorial
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Publish Date: Sep 14, 2006


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Choosing the Best Measurement Devices for Your System Needs

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This presentation focuses on the the device I/O layer of the hybrid multiplatform system architecture and how to choose the best measurement devices for your test system. This layer encompasses the individual instruments you use to meet your measurement needs. When designing test systems, choose the best instruments for your system, which, in turn, determines your ATE buses. When evaluating instruments, consider factors such as measurement functionality, scalability, timing and synchronization, mix and volume, and product life cycle.

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This tutorial (this "tutorial") was developed by National Instruments ("NI"). Although technical support of this tutorial may be made available by National Instruments, the content in this tutorial may not be completely tested and verified, and NI does not guarantee its quality in any way or that NI will continue to support this content with each new revision of related products and drivers. THIS TUTORIAL IS PROVIDED "AS IS" WITHOUT WARRANTY OF ANY KIND AND SUBJECT TO CERTAIN RESTRICTIONS AS MORE SPECIFICALLY SET FORTH IN NI.COM'S TERMS OF USE (http://ni.com/legal/termsofuse/unitedstates/us/).