设计下一代自动化测试系统 NI Home 文件类型: 技术指南 是否NI支持: 是 发布日期: Jun 16, 2008 作者：徐赟, 技术市场工程师, NI中国分公司 测试管理人员和工程师们为了保证产品的质量和可靠性，从设计验证，生产线测试到设备维修诊断，从简单的通过／失败测试应用，到执行全套的产品特性测试，都离不开自动化测试系统的设计与构建。本文要讨论的下一代自动化测试系统正是基于测试测量行业发展的趋势和工程师团队所面临的挑战，通过构建以软件为核心的模块化系统架构帮助工程师们以创新的思维提高测试效率，满足用户自定义的需求。 自动化测试系统面临的设计挑战
Qué hay de nuevo en Test Stand 4.1 Junto con el perfil de recursos, NI TestStand 4.1 presenta soporte para procesadores de múltiples núcleos y administradores de conmutación interactivos.
Neue Funktionen in NI Switch Executive 3.0 NI Switch Executive ist eine intelligente Anwendung zur Verwaltung von Schaltvorgängen und zum Routen von Signalen, welche die Entwicklungszeit verkürzt und die Wartung von Schaltsystemen vereinfacht.
Accelerating Development and Simplifying Maintenance with NI Switch Executive This demo walks you through the rapid development of small and large switch systems using NI Switch Executive. You also learn tips and tricks for making your switch configuration scalable and maintainable. The demo finishes by showing you how to integrate NI Switch Executive into NI TestStand. Media Type: Demo Duration: 6 minute(s)
NI TestStand 4.1 – Accelerating Parallel Test Engineers today are tasked with testing products at significantly higher volumes and levels of technical complexity. Parallel test is an emerging trend for meeting these next-generation challenges.
What's New in NI Switch Executive 3.0 NI Switch Executive is an intelligent switch management and routing application that accelerates development and simplifies management of switch systems. The latest release of this software, NI Switch Executive 3.
Acquiring Waveform Data from an NI DMM in LabVIEW SignalExpress The NI 407x line of DMMs is capable of performing waveform voltage and current acquisitions. However, there currently is not a step available in LabVIEW SignalExpress that will allow the user to acquire waveform data from a DMM. Software: LabVIEW Full Development System Hardware: Digital Multimeters
Sourcing 100 nA with 2 SMUs This example program shows how to use a current divider circuit to obtain 100 nA with 10 nA steps using 2x PXI-4130 SMUs and a PXI-4071 DMM to verify the results Software: LabVIEW Full Development System Hardware: Digital Multimeters
Opens and Shorts Testing Reference Design This document will discuss the technical details of an opens and shorts test system created in PXI. To learn more about the hardware components, click here. To learn more about the software components, click here. To return to the Opens and Shorts Reference Architecture main page, click here.
Wie erstellt man flexible, kosteneffiziente ECU-Prüfsysteme? Da wir jedoch nicht in einer perfekten Welt leben, ist der Test eine Methode, um minimale, messbare, wiederholbare und nachvollziehbare Qualitätsstandards zu sichern. Denn Qualität hat sehr wohl einen Wert, auch wenn dieser nicht in Zahlen gemessen werden kann.
