Performing Particle Analysis

NI Vision 2019 for LabVIEW Help

Edition Date: March 2019

Part Number: 370281AG-01

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This section describes how to perform particle analysis on your images. Use particle analysis to find statistical information—such as the area, number, location, and presence of particles. With this information, you can perform many machine vision inspection tasks, such as detecting flaws on silicon wafers or detecting soldering defects on electronic boards. Examples of how particle analysis can help you perform web inspection tasks include locating structural defects on wood planks or detecting cracks on plastic sheets.

The following figure illustrates the steps involved in performing particle analysis.

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