Owning Palette: Express VIs and Functions
Use the Signal Analysis Express VIs to perform waveform measurements, waveform generation, and signal processing.
| Palette Object | Description |
|---|---|
| Convolution and Correlation | Performs convolution, deconvolution, or correlation on the input signals. |
| Create Histogram | Computes a histogram for Signal. |
| Curve Fitting | Computes the coefficients that best represent the input data based on the chosen model type. |
| Distortion Measurements | Performs distortion measurements on a signal, such as tone analysis, total harmonic distortion (THD), and signal in noise and distortion (SINAD). |
| Dual Channel Spectral Measurement | Performs a dual channel spectral measurement, such as frequency response, on input signals. |
| Filter | Processes signals through filters and windows. |
| Mask and Limit Testing | Performs limit testing on Signals. The Express VI compares Signals with upper and lower limits that you set. |
| Simulate Signal | Simulates a sine wave, square wave, triangle wave, sawtooth wave, or noise signal. |
| Spectral Measurements | Performs FFT-based spectral measurements, such as the averaged magnitude spectrum, power spectrum, and phase spectrum on a signal. |
| Statistics | Returns the selected parameter of the first signal in a waveform. |
| Tone Measurements | Finds the single tone with the highest amplitude or searches a specified frequency range to find the single tone with the highest amplitude. You also can find the frequency and phase for a single tone. |