|NI-DCPower (English | Japanese)|
Channel 0 of the NI PXIe-4154 exhibits a fast transient response, which results in low transient voltage drops in response to large load changes. This capability, combined with its programmable output resistance, allows the NI PXIe-4154 to emulate a battery's response and makes it ideal for testing RFIC power amplifiers, cellular phones, and other portable battery-powered devices.
Channel 1 of the NI PXIe-4154 has a fixed transient response speed configuration. Channel 0 of the NI PXIe-4154 offers two transient response speed configurations, Normal and Fast, that programmatically change the compensation of the voltage control loop. Changing the compensation ultimately changes the bandwidth and stability of the loop.
Fast configures channel 0 to its wide-bandwidth mode, which offers the fastest transient response and lowest voltage dip in the presence of large load changes (for example, 10x to 30x load changes). However, having a wide bandwidth also makes the channel more susceptible to high-reactance loads which could make the output start oscillating. Under these scenarios, the channel can be stabilized by improving the test setup or adding external components. Refer to NI PXIe-4154 Source Stability Under Reactive Loads for more details on stability.
Normal configures channel 0 to a lower bandwidth mode, which results in the best stability at the cost of a slower transient response and higher voltage drop in response to the same load change.
|Normal||Normal transient response time|
|Fast||Fast transient response time|
Refer to the NI PXIe-4154 Specifications for transient response characterization under each transient response speed setting.