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Owning Palette: Eye Diagram Measurements VIs
Requires: Jitter Analysis Toolkit
Defines a region, or mask, with which you want to compare unit intervals in an eye diagram to determine whether values fall within the mask you specify. Masks typically represent an area in the eye opening that you want to ensure unit intervals do not fall within.
Use the Eye Pattern Limit Test VI to compare a signal in an eye diagram to the mask this VI generates and perform limit testing. Refer to the Details section of this topic for more information about using this VI with the rest of the Eye Diagram Measurements VIs.
|time is an array of time values at which mask boundaries intersect on the x-axis. (time, voltage) values at the same indexes define the mask-boundary intersections.|
|voltage is an array of voltage values at which mask boundaries intersect on the y-axis. (time, voltage) values at the same indexes define the mask-boundary intersections.|
|upper limit specifies the upper boundary of the mask you want to apply to voltage values to determine whether the signal falls in the mask.|
|lower limit specifies the lower boundary of the mask you want to apply to voltage values to determine whether the signal falls in the mask.|
|error in describes error conditions that occur before this node runs. This input provides standard error in functionality.|
|mask out returns the input values as a cluster that defines the mask against which you want to test the waveform. Pass this cluster to the Eye Pattern Limit Test VI to perform limit testing, or to the Eye Diagram Support VI to plot the mask in the eye diagram.|
This VI draws lines between (time, voltage) pairs to define the mask boundaries and reorders the pairs to reflect the order in which the VI draws lines between start and end points. This VI also duplicates the (time, voltage) point at the origin of the mask because the VI must draw a line between the final point and the origin to close the mask.
|error out contains error information. This output provides standard error out functionality.|
The following block diagram illustrates a common workflow for using this VI to define a mask for use in limit testing.
Refer to the Mask and Limit Test VI in the labview\examples\Jitter Analysis\Eye Diagram Measurements directory for an example of using the Eye Pattern Mask Definition VI.