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Jitter Analysis VIs

LabVIEW 2012 Jitter Analysis Toolkit Help

Edition Date: June 2012

Part Number: 373270B-01

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June 2012, 373270B-01

Requires: Jitter Analysis Toolkit. This topic might not match its corresponding palette in LabVIEW depending on your operating system, licensed product(s), and target.

Use the Jitter Analysis VIs to perform automated jitter, eye diagram, and phase-noise measurements. You can use these VIs to measure and analyze signal data, and then graph the data in an eye diagram or bathtub plot.

SubpaletteDescription
Clock Recovery VIsUse the Clock Recovery VIs to establish the timing of the reference clock from data within a signal. After you generate a reference clock signal, you can use the Jitter VIs to compare a measured signal with the clock signal to measure jitter.
Eye Diagram Measurements VIsUse the Eye Diagram Measurements VIs to construct an eye diagram that displays information about jitter in a waveform signal. In eye diagrams, corresponding segments of a waveform are superimposed upon each other to illustrate variations in the time at which features in the waveform occur.
Jitter VIsUse the Jitter VIs to measure the jitter in a waveform and separate, or decompose, it into components, such as random jitter, deterministic jitter, and so on. When separated, the individual components of jitter can indicate causes of excessive jitter in the system.
Level VIsUse the Level VIs to perform amplitude and level measurements on a signal and to identify positions in time of waveform features.
Signal Generation VIUse the Signal with Jitter VI to generate signals you can use to test and debug jitter analysis applications.
Timing VIsUse the Timing VIs to return information about the times and locations at which events in a signal occur.

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