NI TestStand 2012 R2 Semiconductor Module New Features

NI TestStand 2017 Semiconductor Module Help

Edition Date: July 2018

Part Number: 373892H-01

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The following list describes the new features in the NI TestStand 2012 R2 Semiconductor Module (TSM) and other changes since the NI TestStand 2012 Semiconductor Module.

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 LabVIEW VIs and Palettes

TSM adds the following new VIs:

  • Create Multisite Digital Waveforms—Creates multisite digital waveforms based on the pin map.
  • Rearrange Multisite Digital Waveforms—Rearranges multisite waveforms read from NI-HSDIO instruments into per-site digital waveforms.
  • Get Pin Names—Returns all DUT and system pins.
  • Get Session And Channel Index VI—Returns the index of the channel group and channel that corresponds to a pin query. Use this VI to access an individual pin when you take a measurement across multiple instruments and pins. When you call a pin query VI, such as the Pins to NI-HSDIO Sessions VI, the VI returns an array of sessions and a channel list. Use the Get Session and Channel Index VI to identify which session and which channel refers to a pin and site number you specify.

TSM adds the following new subpalettes:

  • NI-HSDIO subpalette—Use this subpalette to access the NI-HSDIO VIs and the Multisite Digital Waveform VIs.
  • NI-DCPower subpalette—Use this subpalette to access the NI-DCPower VIs.

 New Reports and Data Logs

You can generate the following new types of TSM reports and data logs. Enable and configure the corresponding TSM result processing plug-in to generate the report or data log.

  • Lot Summary Report—Text file that contains a summary of the semiconductor test results for the current lot of DUTs (test lot).
  • Test Results Log—Human-readable text file that contains the measurement values and test limits for each test that executes on each site.
You can customize the filenames and locations in which the TSM result processing plug-ins create report and data log files by modifying a copy of the GetReportFileName callback.

 Customizing the STDF PRR PartID Field Value

The STDF result processing plug-in sets the PartID field in the Part Results Record (PRR) of the STDF version 4 specification by using the value of the SerialNumber property on the UUT data type. By default, TSM automatically assigns sequential numeric values to the SerialNumber property, which results in unique PartID field values for each PRR.

The NI_SemiconductorModule_StationSettings data type now includes a GenerateUniquePartIds property that specifies whether TSM generates unique values for the PartId field of PRRs in the STDF log file. Set this value to False to generate unique PartID values using a custom algorithm you implement.

 LotTestingComplete Callback

TSM calls the LotTestingComplete callback sequence to perform tasks when a lot completes testing, such as sending generated reports to a central server or displaying a message on the tester to indicate that the tester is idle.

The default implementation of the LotTestingComplete callback sequence is empty. You can override this callback to customize the tasks to perform when a lot completes testing. TSM calls the LotTestingComplete callback after all other process model plug-ins complete execution.

 Improved Lot and Station Settings Configuration Dialog Boxes

The default Configure Lot Settings dialog box includes the following new fields:

  • Device Name
  • Lot Number
  • Estimated Lot Size
  • Test Flow
  • Test Temp
  • Operator ID

The Configure Station Settings dialog box includes the following new fields:

  • Test Failure Mode
  • Number of Sites
  • Additional buttons that launch the standard TestStand Station Options, Search Directories, LabVIEW Adapter, and Result Processing dialog boxes

 Operator Interface Enhancements

The TSM default operator interface now displays the following new information:

  • Average test times, such as Socket Time and Cycle Time, calculated by averaging the last 10 runs of a DUT.
  • Status of the tester with information for operators about how to proceed when testing a lot.
  • Sites that are actively testing DUTs, DUTs that have recently failed on a given site, or sites that are waiting for DUTs to test.
  • Inline QA data, when enabled, such as the number of DUTs that passed and failed during inline QA testing.
  • Errors that occur during execution and that appear in an error log file.

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