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Select Semiconductor Module»Show Lot Statistics Viewer or click the Show Lot Statistics Viewer button on the TSM toolbar to launch the Lot Statistics Viewer window, in which you can view lot statistics, including per-site bin counts, while running or debugging a sequence in the sequence editor. You can also control test program execution in the Lot Statistics Viewer.
The Lot Statistics Viewer displays a new tab for each test program sequence file you execute. The tab includes a table of the software bin statistics for each site and highlights the cell for each updated DUT result. When execution completes, the table dims. Click the expand/collapse button to the left of the software bin name to collapse the view to show only the total part count or to expand the view to show part counts for each software bin.
When you use the AvailableSiteNumbers property on the NI_SemiconductorModule_StationSettings data type to specify which site numbers from a pin map for a test program to use when running the test program, the Lot Statistics Viewer displays only the sites you specify.
The Lot Statistics Viewer window includes the following options: