Scaling Measurement and Limit Data (TSM)

NI TestStand 2017 Semiconductor Module Help

Edition Date: July 2018

Part Number: 373892H-01

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Use the Scaling Factor column in the Tests table on the Tests tab of the Semiconductor Multi Test step to specify the scaling factor for the limits and measurements for each test. TSM assumes that all measurement values that code modules publish use base units.

Specify a scaling factor to select the units you want to use to display and specify limit values and to display measurement values. By default, the limits and the measurement use the same scaling factor. Changing the scaling factor in the Scaling Factor column in the Tests table sets the scaling factor for the limits and for the measurement.

Use the Property Browser panel on the Properties tab of the Step Settings pane to set the following properties to specify different scaling factors for each limit and the measurement:

Property Description
Step.Result.Evaluations[i].NumericLimit.DataScalingExponent Measurement scaling factor
Step.Result.Evaluations[i].NumericLimit.LowLimitScalingExponent Low limit scaling factor
Step.Result.Evaluations[i].NumericLimit.HighLimitScalingExponent High limit scaling factor

Supported Scaling Factors

TSM recognizes the following scaling factors, which correspond to the recognized values for the RES_SCAL, HLM_SCAL, and LLM_SCAL fields of the STDF Parametric Test Records (PTRs):

Scaling Factor Name Scaling Factor Value Units Prefix DataScalingExponent,

LowLimitScalingExponent,

and HighLimitScalingExponent

Property Values
STDF _SCAL Field Value
femto 10-15 f -15 15
pico 10-12 p -12 12
nano 10-9 n -9 9
micro 10-6 u -6 6
milli 10-3 m -3 3
percent 10-2 % -2 2
<blank> 1 0 0
kilo 103 K 3 -3
mega 106 M 6 -6
giga 109 G 9 -9
tera 1012 T 12 -12

The Semiconductor Multi Test step uses the scaling factors for the measurement values and limit values in the following ways:

  • Measurement Value Scaling Factor—The Semiconductor Multi Test step assumes that measurement values that code modules publish use base units. At run time, the Semiconductor Multi Test step uses the measurement scaling factor to display the measurement value in scaled units in the Data column of the Tests table. The STDF Log result processing plug-in stores the corresponding scaling exponent in the RES_SCAL field of the PTRs. The Test Results Log result processing plug-in uses the measurement scaling factor to format the values and units in the Measurement Value column of the Test Results Log.
  • Limits Scaling Factors—The Semiconductor Multi Test step assumes that the limit values in the Low Limit and High Limit columns use scaled units. At run time, the Semiconductor Multi Test step uses the limit scaling factors to convert the limit values to base units to compare the measurement value to the limit values. The STDF Log result processing plug-in stores the corresponding scaling exponents for the low limit and high limit scaling factors in the LLM_SCAL and HLM_SCAL fields of the PTRs. The Test Results Log result processing plug-in uses the limit scaling factors to add units to the values in the Low Limit and High Limit columns of the Test Results Log.

See Also

Exporting and Importing Test Limits with Text Files

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