Load Correlation Offsets Step (TSM)

NI TestStand 2017 Semiconductor Module Help

Edition Date: July 2018

Part Number: 373892H-01

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Use the Load Correlation Offsets step only in the ProcessSetup sequence to load and apply correlation offset values to test results on a per-site basis at run time before evaluating the test result data against limits. The step stores the offset value to apply in the Step.Result.Evaluations[index].NumericLimit.CorrelationOffset property on Semiconductor Multi Test steps. The Semiconductor Multi Test step adds the correlation offset to the test result data before evaluating against limits. The Test Results Log includes the correlation offset values.

Configuring the Step

Use the Load Correlation Offsets Step edit tab in the TestStand Sequence Editor to specify the correlation offsets file to use.

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