Semiconductor Multi Test Step

NI TestStand 2017 Semiconductor Module Help

Edition Date: July 2018

Part Number: 373892H-01

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Use the Semiconductor Multi Test step to evaluate one or more parametric or functional tests for the DUT. A single Semiconductor Multi Test step can specify multiple parametric or functional tests. You can configure multisite, binning, and per-site input options directly on the step.

Note Note  The Semiconductor Multi Test step type is not designed to execute in loop blocks that the TestStand For step and For Each step create. Using multiple Semiconductor Multi Test steps in a loop can result in incorrect step results in certain multisite situations. To avoid incorrect behavior of Semiconductor Multi Test steps in a loop, the last step in the loop block must be a Semiconductor Multi Test step with the Multisite Option set to One thread only.

Configuring the Step

You can configure a single Semiconductor Multi Test step test to evaluate a Boolean or numeric measurement against specified limits. Each numeric limit test can have independent limits, base units, comparison type, and software bin. Configure each measurement the same way you configure an individual Numeric Limit Test step. A Semiconductor Multi Test step passes when none of the specified tests fail.

Use the Semiconductor Multi Test step edit tabs in the TestStand Sequence Editor to specify the tests, comparison, limits, multisite, binning, and per-site input options.

Step Properties

The Semiconductor Multi Test step type defines a set of step properties and constants, in addition to the built-in properties common to all TestStand steps.


See Also

Test Program Editor

Exporting and Importing Test Limits with Text Files

Multisite Programming Techniques

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