Semiconductor Multi Test Tests Tab

NI TestStand 2017 Semiconductor Module Help

Edition Date: July 2018

Part Number: 373892H-01

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The Tests tab contains a table that lists the tests the step performs.

Modifying the Layout and Entering Data

You can modify the layout of the Tests table in the following ways:

  • Use the buttons located to the right of the table to add, remove, or reorder tests.
  • Drag column headers to reorder columns.

You can enter data in the table in the following ways:

  • Enter data when a cell is highlighted.
  • Click in a cell when it is highlighted.
  • Double-click a cell.
  • Select a value from a drop-down menu.
  • Drag a variable or property from the Variables pane to a text or expression cell.

Copying and Pasting Data

You can copy and paste data in the Tests table in the following ways:

  • Press <Ctrl-C> to copy the contents of selected table rows, columns, or cells to the clipboard.
  • Press <Ctrl-V> to insert data from the clipboard into the table starting from the top left selected cell. If the number of rows of data on the clipboard is greater than the number of tests in the Tests table, the paste command adds new tests to the step to match the clipboard data.
  • You can copy data to tests on the same Semiconductor Multi Test step, to tests on other Semiconductor Multi Test steps, or to a Microsoft Excel spreadsheet.
  • When you modify the data in Excel and paste it back to a Semiconductor Multi Test step, the step returns an error if the modified data is invalid for a test.

Columns

The Tests table contains the following columns:

  • Test Number—The test number. If you do not specify a test number, the step assigns the value 0. The step stores this value in the Step.Result.Evaluations[i].TestNumber property. For tests that correspond to a pin in a pin group, the step sets the test number to a value that equals the sum of the test number specified for the pin group test and the zero-based index of the pin in the pin group.

    TSM uses the test number and test name to identify the test in an STDF log file.
  • Test Name—A string that identifies or describes the test. The step stores this string in the Step.Result.Evaluations[i].TestName property. For tests that correspond to a pin in a pin group, the step sets the test name to a string that consists of the test name specified for the pin group test concatenated with the pin name.
  • Pin—The pin or pin group to test. The step stores this value in the Step.Result.Evaluations[i].Pin property.

    When you specify a valid pin map file in the Test Program Editor, this cell contains a drop-down menu that includes the pin groups, DUT pins, and system pins the pin map defines. If the pin map file is invalid or if you do not specify a pin map file, this cell contains an editable string.

    If you specify a pin group, the Tests table inserts a test for each pin in the pin group. These inserted tests are not editable and are identical to the test that specifies a pin group, with the following exceptions:
    • The Pin column is set to the name of a pin in the pin group.
    • The Test Number column is computed by adding the test number specified for the pin group test to the zero-based index of the pin in the pin group.
    • The Test Name column is computed by appending the name of the pin in the pin group to the test name specified for the pin group test.
    Although the step does not save the inserted tests in the sequence file, at run time the step adds and performs tests identical to these inserted tests. The pin group test does not appear at run time or in log files or reports.
    Note Note  To use a different numbering scheme for test numbers or a different naming scheme for the test name for pins in a pin group, copy the tests that were inserted for the pin group, delete the pin group test, and paste the copied tests into the Tests table. You can then edit the test numbers and test names directly.
  • Published Data Id—A string that identifies the measurement. The string can be empty, but if the code module the step calls performs multiple measurements for a single pin, the code module must distinguish the different measurements using unique values for the published data ID when the code module uses the TSM Code Module API to publish the measurement data. The step stores this string in the Step.Result.Evaluations[i].MeasurementId property.

    This option is not available when you specify an expression in the Test Data Source cell.
  • Low Limit—A numeric expression that specifies the low limit. This option is available only when you select Numeric Limit in the Evaluation Type column. The step stores this expression in the Step.Result.Evaluations[i].NumericLimit.LowLimitExpr property.

    If you specify a low limit, you must also specify a high limit. Use the Evaluation Comparison Mode option on the Options tab to configure how the step evaluates the limits.

    If you do not specify a low limit and high limit, the step skips the comparison and logs only the measurement value in an STDF logfile.
  • High Limit—A numeric expression that specifies the high limit. This option is available only when you select Numeric Limit in the Evaluation Type column. The step stores this expression in the Step.Result.Evaluations[i].NumericLimit.HighLimitExpr property.

    If you specify a high limit, you must also specify a low limit. Use the Evaluation Comparison Mode option on the Options tab to configure how the step evaluates the limits.

    If you do not specify a low limit and high limit, the step skips the comparison and logs only the measurement value in an STDF logfile.
  • Scaling Factor—The scaling factor to use for the measurement and limit values. The step assumes that measurement values are in base units and that limit values are in scaled units. The Tests table displays all values in scaled units.
  • Base Units—A string that specifies the base units associated with the limits and the measurement. This option is available only when you select Numeric Limit in the Evaluation Type column. The step stores this string in the Step.Result.Evaluations[i].NumericLimit.Units property.
  • Software Bin—The test software bin. This bin must be a valid fail bin. The step stores this value in the Step.Result.Evaluations[i].FailBin property.

    If the test fails and TSM has not yet assigned a software bin to the DUT, the step assigns this software bin to the DUT.

    When you specify a valid bin definitions file in the Test Program Editor, this cell contains a drop-down menu that includes the software fail bins the bin definitions file defines. If the bin definitions file is invalid or if you do not specify a bin definitions file, this cell contains an editable string.

    If you do not specify a software bin, the step stores the value -1, which specifies that no binning occurs for the test.
  • Evaluation Type—The Numeric Limit, Pass/Fail, or None evaluation type. Use a Numeric Limit evaluation for a parametric test, and use a Pass/Fail evaluation for a functional test. Use the None evaluation type to publish data from a code module without evaluating the data. The step stores this value in the Step.Result.Evaluations[i].EvaluationType property.

    When you select the Pass/Fail or None evaluation type, the Low Limit, High Limit, and Base Units cells are not available.
  • Test Data Source—An optional expression that specifies the measurement data to use for the test. The step stores this expression in the Step.Result.Evaluations[i].MeasurementSourceExpr property.

    When you specify an expression, the Pin and Published Data Id cells are not available.

    If you do not specify an expression, you must use the Code Module API in the code module the step calls to publish the measurement data to the test. This expression must be a numeric value for tests with a Numeric Limit evaluation type or must be a Boolean value for tests with a Pass/Fail evaluation type. This expression must be a Boolean, numeric, or string value for None evaluation type tests.
  • Export Data To—An optional expression that specifies a location to copy the measurement data from the test. Use this expression when you need to refer to the measurement in subsequent steps. The step stores this expression in the Step.Result.Evaluations[i].MeasurementDestinationExpr property. For tests that refer to a pin group, use an array expression to copy the measurement data for each pin test to an element in the array. The step automatically adjusts the size of the array to have enough elements to contain the data for each pin in the pin group.

The following columns are available only in the Execution window for a Semiconductor Multi Test step suspended at a breakpoint during an execution:

  • Status—The status of the test.
  • Data—The measurement data associated with the test.

See Also

Exporting and Importing Test Limits with Text Files

Semiconductor Multi Test Step Constants

Semiconductor Multi Test Step Properties

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