Semiconductor Multi Test Step Properties

NI TestStand 2017 Semiconductor Module Help

Edition Date: July 2018

Part Number: 373892H-01

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The Semiconductor Multi Test step type defines the following step properties:

  • Result.Evaluations—An array that stores the tests you configure for the step on the Tests edit tab. The NI_SemiconductorModule_Evaluation data type defines the following fields:
    • EvaluationType—The type of evaluation the test performs. The default evaluation type is Numeric Limit.
    • Pin—A string that stores the test pin or pin group.
    • MeasurementId—A string that stores the published data ID.
      Note Note  The TSM Code Module API uses the EvaluationType, Pin, and MeasurementId properties to publish measurements from the code module to the corresponding tests the Semiconductor Multi Test step specifies.
    • TestNumberExpr—An expression that determines the test number at run time. If this expression is not empty, the Semiconductor Multi Test step evaluates the expression and copies the evaluated value to the TestNumber property.
    • TestNumber—A number that stores the test number.
    • FailBin—A number that stores the software fail bin for the test.
    • TestNameExpr—An expression that determines the test name at run time. If this expression is not empty, the Semiconductor Multi Test step evaluates the expression and copies the evaluated value to the TestName property.
    • TestName—A string that stores the test name.
    • MeasurementSourceExpr—An expression that determines the numeric or Boolean measurement value at run time. If this expression is empty, the step obtains the measurement data from the Code Module API in the code module the step calls.
    • MeasurementDestinationExpr—An optional expression that specifies a custom location to store the numeric or Boolean measurement value after the step performs the test.
    • Status—A string that stores the Passed, Failed, Done, Skipped, or Error test result.
    • NumericLimit—The NI_SemiconductorModule_Evaluation_NumericLimit data type defines the following fields:
      • Data—A number that stores the numeric measurement value. The step obtains this value from the Code Module API in the code module the step calls or from the MeasurementSourceExpr property.
      • LowLimitExpr, LowLimit, HighLimitExpr, and HighLimit—The limits for the test.
      • ComparisonType—The type of comparison, such as "GELE".
      • Units—A string that stores the base units for the limits and measurement value.
      • DataScalingExponent, LowLimitScalingExponent, HighLimitScalingExponent—Numbers that determine the scaling factors for the measurement value and each limit value. Each of these properties contains an integer value that TSM uses as an exponent for the number 10 to determine the scaling factor.
      • CorrelationOffset—The correlation offset value to apply to test results on a per-site basis at run time before evaluating the test result data against limits. The Load Correlation Offsets step sets this property.
    • PassFail—The NI_SemiconductorModule_Evaluation_PassFail data type defines the following fields:
      • Data—A Boolean value the step obtains from the Code Module API in the code module the step calls or from the MeasurementSourceExpr property.
  • Result.SemiconductorCommon—A container that stores run-time data about the step. The NI_SemiconductorModule_SemiconductorCommon data type defines the following field:
    • Sites—A string that stores a comma-separated list of site numbers for which the code module of the step executed. The step sets this property at run time.
  • SemiconductorModuleContext—An object reference that stores the SemiconductorModuleContext object the step code module uses. The SemiconductorModuleContext object describes a subset of pins, sites, and instruments on a test system. Code modules use this property to access the Code Module API.
  • Multisite—A container that stores the multisite options you configure for the step on the Options edit tab. The NI_SemiconductorModule_Multisite data type defines the following fields:
    • SynchronizationOption—The multisite option. The default option is one thread per subsystem.
    • DUTPinFilterOption—The option for determining what pins to include in the SemiconductorModuleContext object for the step. By default, all DUT pins are included.

      You might want to include a subset of DUT pins if you have a test that executes on only a subset of DUT pins because the Semiconductor Multi Test step might synchronize across fewer sites, which can increase parallelism in the test system.

      If you try to access a pin that is not included in the SemiconductorModuleContext object, the step returns an error.
    • IncludedDUTPins—An array that stores the DUT pins to include in the SemiconductorModuleContext object for the step. The step uses this array only when the DUTPinFilterOption property is set to 1.
    • ExcludedDUTPins—An array that stores the DUT pins to exclude from the SemiconductorModuleContext object for the step. The step uses this array only when the DUTPinFilterOption property is set to 0.
    • IncludeSystemPins—A Boolean value that specifies whether to include all system pins in the SemiconductorModuleContext object for the step.
    • IncludedPinGroups—An array that stores the pin groups to include in the SemiconductorModuleContext object for the step.
  • EvaluationFailureOption—The test failure option. The default value is stop on failure.
  • DotNetRuntimeData—A hidden object reference that substeps of the Semiconductor Multi Test step use to cache run-time information about the step. Do not directly interact with this property.
Notes Notes
  • The numeric representation for the numeric limit data and limit values must be double-precision, 64-bit floating-point values, and cannot be signed or unsigned 64-bit integers.
  • The Step.Result.Evaluations[i].TestNameExpr property does not correspond to an option on the Semiconductor Multi Test step edit tabs.
  • The Semiconductor Multi Test step uses the Step.Multisite.DUTPinFilterOption, Step.Multisite.IncludedDUTPins, Step.Multisite.ExcludedDUTPins, and Step.Multisite.IncludeSystemPins properties only when the step executes in a non-controller thread of the Batch process model. In all other cases, the step includes all DUT pins and system pins.

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