Test Steps and Flow (TSM)

NI TestStand 2017 Semiconductor Module Help

Edition Date: July 2018

Part Number: 373892H-01

»View Product Info
Download Help (Windows Only)

A test step is an instance of the Semiconductor Multi Test step type or a custom step type based on the Semiconductor Multi Test step type that performs one or more parametric or functional tests. A test step calls a code module implemented in LabVIEW or .NET to control the instrumentation on the tester, take measurements from the DUT, and pass measurement values back to the Semiconductor Multi Test step. The step performs parametric and functional tests using the measurement values obtained from the code module. The Main sequence of a test program sequence file defines the test steps to execute and the order in which to execute them. You can use standard TestStand control flow features, such as preconditions and Flow Control step types, to control the test flow.

To skip subsequent tests when a test fails, enable the Stop Performing Tests after First Failure option on the Options tab of the Semiconductor Multi Test step in the sequence editor and also set the On Step Failure sequence option to Goto Cleanup on the General tab in the Sequence Properties dialog box. To skip one or more tests based on specific conditions, use the Get Test Information step to save the condition in a local variable and use an expression that refers to the variable in a precondition expression or in the condition expression of an If step. Skipping a test step execution skips all tests associated with the test step.

Note Note  The Semiconductor Multi Test step type is not designed to execute in loop blocks that the TestStand For step and For Each step create. Using multiple Semiconductor Multi Test steps in a loop can result in incorrect step results in certain multisite situations. To avoid incorrect behavior of Semiconductor Multi Test steps in a loop, the last step in the loop block must be a Semiconductor Multi Test step with the Multisite Option set to One thread only.

Programming Multiple Test Flows in a Test Program

You can execute multiple test flows from a single test program. A test program can contain multiple configurations to specify values for test conditions that can control execution flow. Use the Test Program Editor to specify configurations and test condition values for a test program.

TSM sets available test configurations when you configure a lot for execution. You can use the values of test conditions to control the flow of the sequence when used as inputs to TestStand Flow Control step types. Use the Get Test Information step type to obtain the value of a test condition at run time. You can specify the TestFlowId standard lot setting as a standard test condition that identifies the test flow in an STDF log file.

Performing Tasks after all Tests Complete

If the test program does not use part average testing, you can perform tasks after all tests have completed by adding steps to the Cleanup step group of the MainSequence sequence. If the test program uses part average testing, you must use the OnSiteTestingComplete callback sequence to perform tasks after all tests have completed because TSM performs the part average testing after the MainSequence sequence executes.

TSM assigns a bin to the DUT after the MainSequence sequence executes and after performing part average testing tests. Regardless of whether the test program uses part average testing, to perform a task that requires access to the bin assigned to the DUT, you must use the OnSiteTestingComplete callback sequence.

In general, do not use the PostUUT Model callback because TestStand calls this callback after TSM sends the end-of-test (EOT) notification to the handler or prober. As a result, you cannot perform operations on a DUT in the PostUUT callback.


Not Helpful