Advanced VIs (TSM)

NI TestStand 2017 Semiconductor Module Code Module VIs Help

Edition Date: July 2018

Part Number: 373951H-01

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Use the Advanced VIs to create custom VIs for instruments that TSM does not natively support, query the site numbers in the Semiconductor Module context, and manage per-site and global data.

The VIs on this palette return general LabVIEW error codes.

Palette Object Description
Get Site NumbersReturns the site numbers and number of sites in the Semiconductor Module context.
Get Session And Channel IndexReturns the index of the channel group and channel that corresponds to a pin query. Use this VI to access an individual pin when you take a measurement across multiple instruments and pins. When you call a pin query VI, such as the Pins to NI-HSDIO Sessions VI, the VI returns an array of sessions and a channel list. Use the Get Session and Channel Index VI to identify which session and which channel refers to a pin and site number you specify.
Get Input DataReturns per-site input data as defined in the Semiconductor Multi Test step. You must manually select the polymorphic instance you want to use.
Filter PinsFilters the pins by instrument type ID. Pass a list of all pins or pin groups to return the pins connected to instruments of the type you specify in the Instrument Type Id parameter. If no pins are connected to instruments of the type you specify in the Instrument Type Id parameter, this VI returns an empty array.
Extract Pin DataExtracts the measurement data for a specified pin from measurements obtained from an instrument and arranges the data in the order of sites in the Semiconductor Module context.
Get All Session DataReturns all sessions in the Semiconductor Module context that belong to instruments of the type you specify in the Instrument Type Id parameter.
Get All Instrument DefinitionsReturns the channel group ID and associated instrument names and channel lists of all instruments of type Instrument Type Id defined in the Semiconductor Module context. You can use instrument names, channel group IDs, and channel lists to open driver sessions.
Set Session DataAssociates a session with an instrument and channel group.
Get Session DataReturns the session data, channel group IDs, and channel lists required to access one or more pins for a specified instrument type ID. You must manually select the polymorphic instance you want to use.
Get Pins In Pin Group(s)Returns a list of pins contained in the pin group or list of pin groups you specify. You must manually select the polymorphic instance you want to use.
Set Site DataAssociates a data item with each site. You can associate data with all sites or with the subset of sites in the Semiconductor Module context. You can use this VI to store instrument sessions or other per-site data you initialize in a central location but access within each site. The data item is accessible from a process model controller execution and the site with which the data is associated.
Get Site DataReturns per-site data that a previous call to the Set Site Data VI stores. The returned array contains the data the Semiconductor Module context stores for each site in the same order as the sites that the Get Site Numbers VI returns.
Set Global DataAssociates a data item with a data ID. You can use this VI to store an instrument session or other data you initialize in a central location but access from multiple sites. The data item is accessible from a process model controller execution and all of its test socket executions.
Get Global DataReturns a global data item with the data ID that a previous call to the Set Global Data VI stores.
Get Relays In Relay Group(s)Returns a list of relays contained in the relay group or list of relay groups you specify. You must manually select the polymorphic instance you want to use.

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