PXIe-4464 Calibration Procedure

Calibration Executive 5.0 Help

Edition Date: June 2019

Part Number: 374564R-01

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This topic contains information for calibrating the National Instruments PXIe-4464 using Calibration Executive.

Calibration Executive Procedure Features:

Adjustment

Supported
Manual Mode

Supported
Selectable Test Points

Unsupported

Approximate Test Time:

Verify Only
25 minutes
Verify & Adjust
50 minutes
Test Equipment|Test Conditions|Device Setup|Test Limit Equations

Test Equipment

The following table lists the test instruments required for calibrating the PXIe-4464.

Instrument Recommended Model Specification Value
Calibrator Fluke 5700A AI Gain Frequency Range: 40 Hz to 92.2 kHz

Voltage Range: up to 6.3 Vrms

ACV Accuracy:
40 Hz: 0.017%
1 kHz: 0.016%
20 kHz: 0.017%
45 kHz: 0.087%
92.2 kHz: 0.29%

Function Generator Keysight (Agilent) 33250A Timebase Frequency Frequency Range: p to 90 kHz

Frequency Accuracy: 2 ppm

Voltage Range: up to 9 Vpk

DMM PXI-4070 IEPE Current Current Accuracy: 0.9%
BNC Shorting Cap (x4) Pomona Electronics 5085 or 3840-50 AI Offset Resistance: ≤50 Ω
BNC F-F-F T-Connector (x3) Pomona Electronics 3284 AI Gain Characteristic Impedance: 50 Ω
BNC (F) to Banana Adapter Pomona Electronics 1269 AI Gain
BNC (M) Cable Pomona Electronics 5697 AI Gain Characteristic Impedance: 50 Ω
mXLR (F) to BNC (M) Cable
(BNC variant: x7
mXLR variant: x4)
NI 156789-XX or NI 140150-XX

0R46 (0.46 m)
0R91 (0.91 m)
2R4 (2.4 m)
All
BNC F-F Adapter* (x4) Pomona Electronics 3283 AI Offset
PXI Express Chassis PXIe-1062Q, PXIe-1075 Any PXI Express chassis meets requirements.
*  Required only for the mXLR variant.

Test Conditions

The following setup and environmental conditions are required to ensure the PXIe-4464 meets published specifications.

  • Keep connections to the device as short as possible. Long cables and wires act as antennas, picking up extra noise that can affect measurements
  • Verify that all connections to the device are secure.
  • Maintain an ambient temperature of 23 °C ±5 °C. The device temperature will be greater than the ambient temperature.
  • Keep relative humidity below 80%.
  • Allow a warm-up time of at least 15 minutes to ensure that the measurement circuitry of the PXIe-4464 is at a stable operating temperature.
  • Allow a warm-up time for all of the instruments and equipment according to the manufacturer instructions.

Device Setup

  1. Install the hardware as described in the NI PXIe-4464 Getting Started Guide.
  2. Configure the hardware using Measurement & Automation Explorer (MAX).
  3. Launch the Calibration Executive procedure. Calibration Executive guides you through the required connections.
Note  For mXLR variation PXIe-4464 DUTs, an mXLR (F)-to-BNC (M) adapter is needed for each channel, and can be connected before the procedure is run.

Note that the AI Flatness Verification step uses measurements recorded in the AI Gain Accuracy Verification step as the 1 kHz reference point for flatness calculations for the corresponding gain setting.

Switch Support and Maintenance

With switches enabled, the PXIe-4464 procedure automatically executes a rudimentary connection test immediately after setup to ensure that all switch paths are correctly connected to their appropriate channels.

To ensure proper operation of the switches used in this procedure, you must periodically test the performance of your switch. Refer to the NI 2503/2529 Switch Performance Test for instructions on validating the performance of the NI 2529 used in this procedure.

This procedure supports automation using an NI 2529 switch matrix. To enable automation, you must make the following connections from the test system to the switch:

  • Connect switch channels C0 +/- through C3 +/- to DUT channels 0 +/- through 3 +/-, respectively.
  • Connect switch channel R0 +/- to the DMM current +/- terminals.
  • Connect switch channel R1 +/- to the calibrator volts +/- terminals.
  • Connect switch channel R2 +/- to the function generator +/- terminals.
  • Connect a short across switch R3 and terminals.

Test Limit Equations

The following test limits are derived from the published specifications and apply to the As Found limits for this device.

AI Offset

Gain (dB) AI Offset, Vpk (mV)
30 ±0.1
20 ±0.15
10 ±0.3
0 ±0.9
-10 ±3.0
-20 ±9.0

AI Gain

AI Gain = ±0.3 dB of Vrms value

AI Flatness

Value of flatness coefficients as compared to 1 kHz reference measurement

Gain (db) Frequency
>30 Hz – 20 kHz >20 kHz – 45 kHz >45 kHz – 92.2 kHz
0, 10, 20, 30 ±0.006 dB ±0.03 dB ±0.1 dB
-20, -10 ±0.2 dB ±0.6 dB ±1 dB

AI Noise

Gain (dB) ƒs = 51.2 kS/s
Max (µVrms)
30 1.4
20 2.0
10 4.7
0 14.0
-10 117
-20 197

IEPE Current

IEPE Current Setting (mA) Min (mA)
4 4.0
10 9.6
20 19.3

Timebase Frequency

Timebase Frequency = ±27 ppm of test value

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