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This topic contains information for calibrating the National Instruments PXIe-4464 using Calibration Executive.
Calibration Executive Procedure Features:
|Adjustment||Manual Mode||Selectable Test Points
Approximate Test Time:
|Verify & Adjust
|Test Equipment|||||Test Conditions|||||Device Setup|||||Test Limit Equations|
The following table lists the test instruments required for calibrating the PXIe-4464.
|Calibrator||Fluke 5700A||AI Gain||Frequency Range: 40 Hz to 92.2 kHz
Voltage Range: up to 6.3 Vrms
|Function Generator||Keysight (Agilent) 33250A||Timebase Frequency||Frequency Range: p to 90 kHz
Frequency Accuracy: 2 ppm
Voltage Range: up to 9 Vpk
|DMM||PXI-4070||IEPE Current||Current Accuracy: 0.9%|
|BNC Shorting Cap (x4)||Pomona Electronics 5085 or 3840-50||AI Offset||Resistance: ≤50 Ω|
|BNC F-F-F T-Connector (x3)||Pomona Electronics 3284||AI Gain||Characteristic Impedance: 50 Ω|
|BNC (F) to Banana Adapter||Pomona Electronics 1269||AI Gain||—|
|BNC (M) Cable||Pomona Electronics 5697||AI Gain||Characteristic Impedance: 50 Ω|
|mXLR (F) to BNC (M) Cable
(BNC variant: x7
mXLR variant: x4)
|NI 156789-XX or NI 140150-XX
0R46 (0.46 m)
0R91 (0.91 m)
2R4 (2.4 m)
|BNC F-F Adapter* (x4)||Pomona Electronics 3283||AI Offset||—|
|PXI Express Chassis||PXIe-1062Q, PXIe-1075||—||Any PXI Express chassis meets requirements.|
|* Required only for the mXLR variant.|
The following setup and environmental conditions are required to ensure the PXIe-4464 meets published specifications.
|Note For mXLR variation PXIe-4464 DUTs, an mXLR (F)-to-BNC (M) adapter is needed for each channel, and can be connected before the procedure is run.|
Note that the AI Flatness Verification step uses measurements recorded in the AI Gain Accuracy Verification step as the 1 kHz reference point for flatness calculations for the corresponding gain setting.
With switches enabled, the PXIe-4464 procedure automatically executes a rudimentary connection test immediately after setup to ensure that all switch paths are correctly connected to their appropriate channels.
To ensure proper operation of the switches used in this procedure, you must periodically test the performance of your switch. Refer to the NI 2503/2529 Switch Performance Test for instructions on validating the performance of the NI 2529 used in this procedure.
This procedure supports automation using an NI 2529 switch matrix. To enable automation, you must make the following connections from the test system to the switch:
The following test limits are derived from the published specifications and apply to the As Found limits for this device.
|Gain (dB)||AI Offset, Vpk (mV)|
AI Gain = ±0.3 dB of Vrms value
Value of flatness coefficients as compared to 1 kHz reference measurement
|>30 Hz – 20 kHz||>20 kHz – 45 kHz||>45 kHz – 92.2 kHz|
|0, 10, 20, 30||±0.006 dB||±0.03 dB||±0.1 dB|
|-20, -10||±0.2 dB||±0.6 dB||±1 dB|
|Gain (dB)||ƒs = 51.2 kS/s
|IEPE Current Setting (mA)||Min (mA)|
Timebase Frequency = ±27 ppm of test value