Discovering New Techniques for Closed-Loop Test

Overview

Explore new techniques for challenging applications in test such as those requiring closed-loop capabilities. From hardware-in-the-loop to protocol-aware ATE, these applications require fast response times, determinism, and often programmable silicon. See use cases and solutions that implement user-programmable FPGAs to learn how virtual instrumentation empowers engineers and vertical domain experts to tackle these applications. This presentation is from the Virtual Automated Test Summit.

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