X Series

Overview

National Instruments has taken multifunction data acquisition to the next level with NI X Series, delivering improvements at every level of the device: the I/O, the timing capabilities, and the bus interface. Watch NI engineers demonstrate an application of an X Series device performing a 3D scan of an object and plot the results in LabVIEW. We could have used three NI M Series devices to run this application, but thanks to new NI-STC3 technology, it is possible to achieve this with a single X Series device.

View Now 5 minute(s) video Requires: Adobe Flash

Next Steps

Thank you for your interest in the National Instruments NIWeek 2009 Keynote Videos. Below are some additional resources to help you learn more.

Additional Resources View the other NIWeek 2009 keynote videos If you have questions, would like to request a visit, or speak to a technical representative, click the "real-time assistance" button below. Or, if you are outside the U.S. or Canada, call your local branch office. Worldwide Office Addresses and Phone Numbers. .

Questions?  Get real-time assistance now!

Reader Comments | Submit a comment