Semiconductor Test

Overview

National Instruments offers a variety of products for testing common semiconductor devices, including ADCs/DACs, Power Management ICs, Wireless ICs, and microelectromechanical system (MEMS) devices for both characterization and production environments. PXI and LabVIEW offer a flexible platform for taking custom, one-off measurements to quickly measure the performance of a chip. Jeremy Meier, group manager, and Ryan Mosley, senior HW engineer for PXI and modular instruments R&D at National Instruments demonstrate testing four evaluation boards from Analog Devices. They also introduce three new products – the NI PXI-4132 high-precision source measure unit (SMU) and NI PXIe-6544/45 100 and 200 MHz high-speed digital I/O instruments during the NIWeek 2009 keynote address on Tuesday, August 4, 2009.

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Additional Resources Learn more about NI products for semiconductor test View the other NIWeek 2009 keynote videos Explore LabVIEW for Automated Test If you have questions, would like to request a visit, or speak to a technical representative, click the "real-time assistance" button below. Or, if you are outside the U.S. or Canada, call your local branch office. Worldwide Office Addresses and Phone Numbers.

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