RF Summit - Multiple Wireless Standards - One Platform

Overview

Presented by Dr. James Truchard, President, CEO, and Cofounder, National Instruments

Learn about emerging wireless standards and PXI, a modular instrumentation standard, as a flexible test platform to meet the needs of fast-changing wireless devices. This presentation was recorded at NIWeek 2006.

View Now 28 minute(s) webcast Requires: Windows Media Player Please disable your browser's pop-up blocker to view this content.

Reader Comments | Submit a comment