Parametric Characterization and Hardware-Compare with the Digital Waveform Editor
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View this webcast to understand what effect the Round Trip Delay (RTD) has on a digital test system, and how it can be compensated for. Using Real-Time Hardware Compare and the Digital Waveform Editor, it is straightforward to characterize the RTD of a digital system. This is achieved by creating a pseudo-random bit sequence in the Digital Waveform Editor, and performing a stimulus/response test using LabVIEW Signal Express and the NI PXI-6552 digital waveform generator/analyzer.
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17 minute(s) webcast |