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The IEEE Standards Coordinating Committee 20 (SCC20) directs the development of ATML standards for exchanging the following unit under test (UUT) test and diagnostic information among components of a test system:
The IEEE Std 1671 standard defines the ATML framework and specifies a set of common XML formats. Related standards specify XML formats for exchanging various categories of UUT test and diagnostic information. The ATML Test Description (TD) standard, IEEE Std 1671.1, specifies the XML format for exchanging the TD information.
Use the ATML TD standard and its associated standards to identify and document the descriptions of tests that can be used to implement a test program to test a UUT.
The ATML standards use XML schemas to specify formats. The <TestStand>\Components\Translators\ATMLTDTranslator\Schemas directory contains the following XML schemas the IEEE Std 1671 and IEEE Std 1671.1 (1.01 and 3.0) standards define:
ATML TD instance documents can also refer to the following XML schemas related to the IEEE Std 1641 standard and also located in the <TestStand>\Components\Translators\ATMLTDTranslator\Schemas directory:
Refer to the IEEE standards listed below for more information about the definition and use of elements these schemas define.
Refer to the following documents on the IEEE Website for more information about the ATML TD standard: