18.0 New Features

Digital Pattern Help

Edition Date: May 2018

Part Number: 375145e

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The following lists describe the new features in the NI-Digital Pattern Driver 18.0 and Digital Pattern Editor 18.0 and other changes since NI-Digital Pattern Driver 17.5 and Digital Pattern Editor 17.5.

Reduced Minimum Edge Separation

NI-Digital Pattern Driver 18.0 reduces the allowable minimum edge separation from 5 ns to 3.75 ns. This reduction, in combination with the edge multiplier feature, enables a speed increase from 200 Mb/s to 266 Mb/s.

Edge Multiplier

The new edge multiplier feature allows you to choose between 1x and 2x mode on a per-pin and per-vector basis. When operating in 2x mode, a vector contains a second data drive, drive return, and compare strobe as well as two pin states per vector in the pattern.

The edge multiplier feature enables dual data rate (DDR) interfacing with up to a 100 MHz clock signal and 200 Mb/s data signal. Using edge multiplier in combination with a shorter edge separation now enables single data rate (SDR) interfacing with a 133 MHz clock signal and 133 Mb/s data signal.

Additionally the Digital Pattern Editor 18.0 adds support for 2x drive and compare edges.

  • You now can configure the timing of the 2x edges in the timing sheet editor and configure and/or view 2x pin states in the pattern grid and waveform views.
  • You also can view the results for bursting 2x pin states in History RAM and pattern grid views.
  • You can perform a Shmoo operation using the 2x edges and spec Shmoo.
  • The Digital Pattern Compiler now supports compiling and decompiling pattern files containing 2x edges.

Programmatic Failure Logging with History RAM API

The NI-Digital Pattern Driver 18.0 provides programmatic access to History RAM data via a new API to support programmatic failure analysis. You can configure and log vector results though the new NI-Digital Pattern Driver API.

Clock Generation

Using the clock generator API, you can now generate a clock signal at a frequency independent of the vector rate of your pattern. You can use each pin to generate a clock at a different frequency.

You also now can generate clock signals on digital pins using the Clock item in the Drive section of the Pin View pane of the Digital Pattern Editor.

Relay Support

The Digital Pattern Editor now supports controlling and viewing the state of relays driven by DAQmx-compatible switches, such as the PXI-2567 Relay Driver Module. You can specify relays using new sections of the pin map file and control and view relays using the Relays section of the System View.

Sourcing Tristate and Compare Pin States

The pattern compiler now supports a digital source and capture opcode called source_d_replace. This opcode enables you to use more pin states with source memory by replacing pin states 0 and 1 with pin states 0, 1, H, L, or X. You can add source_d_replace to any vector to change the interpretation of the source pin states from that vector forward. This feature provides more source waveform flexibility with open-drain busses like I2C.

Additionally you can use the new pin state E with source memory to dynamically source an expected L or H pin state, specified in the source waveform data as 0 or 1, respectively. The E pin state allows users to express source operations on an output or bidirectional pin.

Pattern Waveform View and Expected Waveform in Digital Scope

  • Graphs now more accurately reflect the waveform that the digital pattern instrument will generate. Corner cases that involve certain ordering of drive on/off and compare strobe edges in relation to the other drive edges are more accurately represented in 18.0.
  • The pattern waveform now performs more validation on timing and pin states. Invalid timing and invalid combinations of timing and pin states are shown as double red horizontal lines for vectors in which the issues occur.
  • You can now configure and view results for 2x pin states.

Additional Digital Scope Improvements

  • The digital scope adds support for 2D zoom. You now can zoom vertically and horizontally.
  • You now can press <Ctrl> and move your mouse wheel to zoom.
  • The interaction toolbar on the digital scope graph adds items to support zooming and panning.
  • You now can view results for bursting 2x pin states in the digital scope.
  • You now can use the digital scope when the first vector in a graph uses "-" for a time set. Previous versions of the Digital Pattern Editor required you to explicitly specify the time set for the first vector graphed in the digital scope.
  • The digital scope now supports saving both the actual and the expected plot data to a .csv file for processing with external software.
  • The Digital Pattern Editor 18.0 improves speed in the digital scope, especially when connected to existing instrument sessions for debugging.

PXIe-6571 Support

NI-Digital Pattern Driver 18.0 adds support for the PXIe-6571 digital pattern instrument.

Additional Digital Pattern Editor Improvements

  • The Digital Pattern Editor improves support for loading large pattern files. You can now load larger patterns while using less memory in the Digital Pattern Editor and Digital Pattern Compiler.
  • When possible the Digital Scope, Pattern Graph view, and Shmoo plot now use precision based on the digital instruments' capabilities to display numeric values.
  • You can now apply level sheets and timing sheets directly from the project view using the right-click context menu.

Additional NI-Digital Pattern Driver Improvements

  • The NI-Digital Pattern Driver adds support for LabVIEW 2018 and LabVIEW NXG 2.1.


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