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Specifies the method for performing the ACP measurement.
Assembly: NationalInstruments.RFmx.TdscdmaMX.Fx40 (in NationalInstruments.RFmx.TdscdmaMX.Fx40.dll) Version: 188.8.131.52152 (184.108.40.206152)
|Visual Basic (Declaration)|
Public Enumeration RFmxTdscdmaMXAcpMeasurementMethod
public enum RFmxTdscdmaMXAcpMeasurementMethod
|DynamicRange||The ACP measurement acquires the spectrum using the hardware-specific optimizations for different frequency bands. Use this method to get the best dynamic range. Supported Devices: PXIe-5665/5668R.|
|Normal||The ACP measurement acquires the spectrum using the same signal analyzer setting across frequency bands. Use this method when a higher measurement speed is desirable over a higher dynamic range.|
|SequentialFft||The ACP measurement acquires I/Q samples for a duration specified by the NationalInstruments.RFmx.TdscdmaMX.RFmxTdscdmaMXAcpConfiguration.SetSweepTimeInterval method. These samples are divided into smaller chunks defined by the NationalInstruments.RFmx.TdscdmaMX.RFmxTdscdmaMXAcpConfiguration.SetSequentialFftSize method, and FFT is computed on each of these chunks. The resultant FFTs are averaged to get the spectrum and is used to compute ACP. If the total acquired samples is not an integer multiple of the FFT size, the remaining samples at the end of acquisition are not used for the measurement. Use this method to optimize ACP measurement speed. Accuracy of the results may be reduced when using this measurement method.
The following methods have limited support when you set the RFmxTdscdmaMXAcpConfiguration.ConfigureMeasurementMethod method to SequentialFft.